|Message: Problem with Backscattering signal||Not Logged In (login)|
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Dear Geant4 users ,
I have the following simulation setup:
Layer 1: A sensitive Silicon layer of 50 um thick. This layer is pixilated and I calculated the energy deposition of the incident electrons (Ee=300 keV) per each pixel.
Layer 2: A second Si layer of 100 um thick which is coupled to the sensitive layer (Fig.1). This layer is considered as a mechanical layer and electrons will backscattered from this layer and hit layer1 and additional enery is thus deposited.
My Problem is the following:
Case 1: I calculate the single distribution (energy deposition) in each pixel without taking into account the layer2. Only layer1 is considered. That means there is no backscattered electrons from layer 2.
Case 2: I calculate the single distribution (energy deposition) in each pixel in layer1 by taking into account the layer2. That means backscattered electrons from layer 2 will interact with layer 1 and thus the signal in the layer 1 increases.
From the results of my simulation there is an increase in the sum of the signal distributed over the pixels of the layer1 due the backscattering from layer 2. But there is a lot of pixels (case 2)whose signal is smaller than the signal of the pixels in the case 1 which is strange!. If the backscattered electrons donít hit these pixels the signal distribution should remain the same as in the case 1! Otherwise the signal should increase.
If you need any additional details, please let me know. And thank you very much in advance.
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