|Message: Command-based Scoring and Filtering for Secondaries||Not Logged In (login)|
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Short version: is there a way to use the command-based scoring and filters to measure the flux of secondary particles through a plane/surface? I know that I can set up a filter using the method below, but is there a way to filter/differentiate between primary and secondary protons while using the command-based scoring?
/score/filter/particle protonFilter proton
Also, is there a way to create a filter for all high-Z ions (Z>proton)? Would GenericIon suffice?
I have set up a Geant4 application where the geometry is defined through GDML input files, and the scoring is defined using command-based scoring and filters that are written in input macros. Additional scripts control the runs and the creation of dump files. This allows my simulation to be iterated without re-compiling my G4 application.
Along those lines I am attempting to remain with command-based scoring to track creation of secondaries. Now example RE06DetectorConstruction has the below definition in its DetectorConstruction, and I was wondering if that could be incorporated into a command-based scoring approach? And if so, where/how?
primitive = new G4PSNofSecondary("nElectron",j);
Thanks for any help.
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